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1 article(s) from Kumar, Pravin

Synthesis of Pt nanoparticles and their burrowing into Si due to synergistic effects of ion beam energy losses

Pravin Kumar,
Udai Bhan Singh,
Kedar Mal,
Sunil Ojha,
Indra Sulania,
Dinakar Kanjilal,
Dinesh Singh and
Vidya Nand Singh

Beilstein J. Nanotechnol. 2014, 5, 1864–1872, doi:10.3762/bjnano.5.197

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Figure 1: Electronic and nuclear stopping vs ion energy (SRIM calculation for neon ions incident on Pt).

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Figure 2: AFM images: a) pristine film, b–e) films irradiated with 50 keV, 140 keV, 350 keV and 600 keV, resp...

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Figure 3: Rutherford backscattering spectra of the pristine and the irradiated films (Pt–Si).

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Figure 4: SEM images: a) pristine sample, b) 350 keV ion-irradiated film, and c) 600 keV ion-irradiated film.

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Figure 5: TEM images a) various interfaces, b) density distribution of NPs in ion beam modified region, c) in...

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Figure 6: The distribution of silicon vacancies. The 50 keV neon ions were irradiated at normal incidence on ...

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Figure 7: The distribution of Pt recoils (Pt/cm³ per Ne/cm²). The 50 keV neon ions were irradiated at normal ...

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Figure 8: The XRD patterns of the pristine and the ion irradiated (S_e/S_n = 10) films.

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Full Research Paper

Published 24 Oct 2014

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